PRODUCTS

To help you better understand the FSS 4 solution,
we provide specific performance data and technical features of the cell/module test systems that use it.

PRODUCT

---Probing Technology---

Enabling precise 4-terminal measurement for all types of solar cells, including busbar-less cells

Challenges in measuring busbar-less and multi-busbar cells made accurate measurement difficult with conventional pin-type probing technology because busbars are either microscopic or non-existent.

Furthermore, because pin probes have sliding parts, frequent replacement maintenance was required on solar cell mass production lines.

KOPEL has developed the revolutionary 'FSS 4' probing bar to overcome these challenges.
We achieved ideal 4-terminal measurement through a newly developed special 2D spring that ensures soft, excellent contact with all finger electrodes and a special structure that allows current and voltage measurement at nearly the same point.
With this structure, the thickness of FSS 4 is 1.3mm, less than half that of conventional pin-type bars, minimizing shading effects during measurement even when the number of bars is increased.

Compared to conventional pin-type bars, it has a much longer lifespan and is applicable to all types of solar cells, including those with busbars, shingling, half-cut, perovskite tandem, and IBC cells. It integrates smoothly from R&D to mass production lines.

This is a breakthrough probing technology that resolves the challenges faced by researchers and developers aiming for higher efficiency and lower-cost solar cells.

Various Problems Solved by FSS 4 Technology

FSS 4 technology provides innovative probing solutions.
Introducing the strengths of FSS 4 that surpass conventional systems.

Switch to Line Contact and Stable Connection

Changed from conventional pin contact to line contact with a stable 4-wire connection structure.
Precise IV curve measurement is possible even for innovative cell designs such as busbar-less cells.
Improved contact stability reduces measurement variance, achieving higher precision evaluation.

Ultra-thin Structure

The thickness is approximately 1.2mm, or around 1.8 to 2.0mm, which is thinner than conventional pin-type probes.
This reduces shadows on the cell during measurement, contributing significantly to improved measurement accuracy.
Despite the thin design, connection stability is ensured to achieve high-precision measurement.

Patented High-Reliability Structure

The structure of FSS 4 is patented.
High probe life reliability is achieved through a monolithic structure with no sliding parts.
This ensures high reliability and long-term stability, maintaining measurement consistency over long periods.

Excellent Soft-touch Contact

The unique spring structure achieves soft-touch contact (0.16N/single strip) to finger electrodes. The half-pitch staggered design allows line contact to all finger electrodes.
Delicate contact pressure control provides optimal contact characteristics for sensitive cells such as HJT cells.

Flexible frame/holder structure

FSS 4 is highly compatible with conventional pin-type probing bars in terms of shape, achieving a plug-and-play format that allows for quick and low-cost integration into existing mass-production lines simply by changing holders and frames.
It adapts to all on-site requirements, offering solutions ranging from functionality-focused Smart Wire Frames to simple, efficient frames for mass-production lines.

Excellent Measurement Reproducibility

Achieves excellent reproducibility of ±0.02% or better for Isc and Voc, and ±0.05% or better for Pmax.
Enables consistent high-precision measurement from R&D to mass production, contributing to efficient quality control.
Supports optimization of manufacturing processes and yield improvement through stable IV curve acquisition.

IV Measurement Reproducibility (Dynamic Measurement, 6-inch BBL HJT cell)

In on-site inspections, data variance caused by different operators can lead to uncertainty in decision-making.
Our measurement solution uses a unique mechanism to achieve stable contact that is not affected by the probing angle or pressing force.
By having the system reproduce 'expert techniques,' we contribute significantly to standardizing inspection quality and reducing man-hours.

$I_{sc}$ graph
$V_{oc}$ graph
$P_{max}$ graph
$FF$ graph
$R_s$ graph

Durability (Mechanical durability: over 10 million strokes, PERC cell mass production conditions: 10 million strokes)

Our products have cleared 10 million stroke tests under conditions as rigorous as PERC cell mass production lines.
Wear of the tips and attenuation of spring pressure due to long-term use are suppressed to the limit.
In order to maintain 'contact resistance stability,' which determines measurement reproducibility, over the long term, we will continue to provide highly reliable IV measurement data.

Mechanical Durability Test Graph

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